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Title: US5388517: Method and apparatus for automatic alignment of objects and register mark for use therewith
[ Derwent Title ]


Country: US United States of America

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16 pages

 
Inventor: Levien, Raphael L.; McDowell, VA 24458

Assignee: None

Published / Filed: 1995-02-14 / 1993-09-20

Application Number: US1993000123871

IPC Code: Advanced: B41F 33/14; G03F 7/20; G03F 9/00; H01L 21/027; H01L 21/30;
Core: more...
IPC-7: B41F 13/12;

ECLA Code: G03F7/20T22; G03F9/00; G03F9/00T;

U.S. Class: Current: 101/485; 101/211;
Original: 101/485; 101/211;

Field of Search: 101/181,248,485,486,211,170,171,481 250/491.1,398,492.2 358/454 356/363,401,374 226/002,3,27,28,24

Priority Number:
1993-09-20  US1993000123871
1991-09-24  US1991000764647

Abstract: A register mark and a system for bringing a pair of register marks into alignment is disclosed. A first register mark comprises a plurality of dots of a first frequency, and a second register mark comprises a plurality of dots of a second, generally higher frequency. When the first and second register marks are overlaid, an interference pattern resulting from the difference in frequency is observed. The first and second register marks are in alignment when the interference pattern produces a maximum bright spot in the center of the register mark. A small relative movement of the first and second register marks results in a larger relative movement of center of the bright spot. The position of the bright spot indicates which direction and how much to move the second register mark in order to achieve image registration. In an alternate embodiment of the present invention, the frequency of dots in each register mark is warped with distance from the center of the mark. The frequency of the dots of the second register mark is also warped with distance from the center, but overall has a generally higher frequency of dots as compared to the first register mark. The interference pattern resulting from an overlay of the latter two register marks results in a bright spot which occurs unambiguously when the two register marks are in alignment. At misalignments of more than one dot width, the bright spot breaks up so that the overlaid register marks may serve as quick visual check of proper alignment.

Attorney, Agent or Firm: Jacobson, Allan ;

Primary / Asst. Examiners: Fisher, J. Reed;

Maintenance Status: E2 Expired  Check current status

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Related Applications:
Application Number Filed Patent Pub. Date  Title
US1991000764647 1991-09-24       


       
Parent Case:     This is a continuation of application Ser. No. 764,647, filed Sep. 24, 1991, now abandoned.

Designated Country: DE FR GB 

Family: Show 9 known family members

First Claim:
Show all 48 claims
What is claimed is:     1. A method for aligning first and second objects, wherein said first and second objects are coupled to respective first and second register marks, said first register mark including a first plurality of dots at a first frequency and said second register mark including a second plurality of dots at a second frequency, said method comprising:
  • providing said first register mark including a first plurality of dots at a first frequency arranged in a two dimensional array wherein the frequency of dots in said first register mark is maximum at the center and decreases with radial distance in substantially all directions from the center of said first register mark; and
  • providing said second register mark including a second plurality of dots at a second frequency arranged in two dimensional array wherein the frequency of dots in said second register mark is maximum at the center and decreases with radial distance in substantially all directions from the center of said second register mark, said frequency of dots in said second register mark being greater than said frequency of said dots in said first register mark at corresponding points of said first and second register marks respectively;
  • positioning at least one of said first and second objects so that said second register mark is disposed in overlaid relation to said first register mark, thereby producing a bright spot providing a peak indication having a maximum point substantially common to said first and second overlaid register marks indicative of the registration of said first and second register marks;
  • detecting the position of said bright spot providing a peak indication as said maximum point derived from a set of data points; and
  • moving said one of said first and second objects to reposition said bright spot providing a peak indication towards the center of said one of said first and second register marks.


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Forward References: Show 23 U.S. patent(s) that reference this one

       
U.S. References: Go to Result Set: All U.S. references   |  Forward references (23)   |   Backward references (4)   |   Citation Link

Buy
PDF
Patent  Pub.Date  Inventor Assignee   Title
Buy PDF- 5pp US4273045  1981-06 Crowley  Butler Greenwich Inc. Printing machine registration target
Buy PDF- 17pp US4431923  1984-02 Wang et al.  Hughes Aircraft Company Alignment process using serial detection of repetitively patterned alignment marks
Buy PDF- 19pp US4468706  1984-08 Cahill  Coulter Systems Corporation Imaging by varying the placement of elements in the pixels
Buy PDF- 6pp US4704033  1987-11 Fay et al.  Micronix Corporation Multiple wavelength linear zone plate alignment apparatus and method
       
Foreign References:
Buy
PDF
Publication Date IPC Code Assignee   Title
  EP8604158 1986-07       
  JP59083167 1984-05       
  JP63311735 1988-12       
Buy PDF- 9pp GB2183364A 1987-06  G02B 27/60 THE * GENERAL ELECTRIC COMPANY P L C ALIGNMENT USING GRATINGS HAVING VARYING STRIPE PITCH 


Other Abstract Info: DERABS G1993-102819

Other References:
  • IBM Technical Disclosure Bulletin--vol. 32 No. 10B Mar. 1990.
  • GATF Product Catalog 1991 Edition.


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