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Title: US5151110: Molecular sieve sensors for selective detection at the nanogram level
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Country: US United States of America

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8 pages

 
Inventor: Bein, Thomas; Albuquerque, NM
Brown, Kelly D.; Albuquerque, NM
Frye, Gregory C.; Albuquerque, NM
Brinker, Charles J.; Albuquerque, NM

Assignee: University of New Mexico, Albuquerque, NM
other patents from UNIVERSITY OF NEW MEXICO (599775) (approx. 180)
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Published / Filed: 1992-09-29 / 1990-09-11

Application Number: US1990000580373

IPC Code: Advanced: B01D 53/02; B01D 53/04; G01N 27/00; G01N 29/02; G01N 30/00;
Core: more...
IPC-7: B01D 53/04;

ECLA Code: B01D53/02; G01N27/00B1B; G01N29/02F; S01N30/00; L01D253/106; L01D253/108; L01D253/110; L01D253/202; L01D253/304; L01D257/502; L01D257/702; S01N291/025G; S01N291/042C; S01N291/042E; S01N291/042H;

U.S. Class: Current: 095/140; 095/088; 095/143; 096/101; 096/154;
Original: 055/075; 055/067; 055/208; 055/386; 055/389;

Field of Search: 055/208,270,274,389,197,386,18-21,74,75

Government Interest:     The U.S. government has rights in this invention pursuant to Contract No. DE-AC-04-76DPO0789.

Priority Number:
1990-09-11  US1990000580373

Abstract:     The invention relates to a selective chemical sensor for selective detection of chemical entities even at the nanogram level. The invention further relates to methods of using the sensor. The sensor comprises: (a) a piezoelectric substrate capable of detecting mass changes resulting from adsorption of material thereon; and (b) a coating applied to the substrate, which selectively sorbs chemical entities of a size smaller than a preselected magnitude.

Attorney, Agent or Firm: Millen, White & Zelano ;

Primary / Asst. Examiners: Spitzer, Robert;

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Family: Show 3 known family members

First Claim:
Show all 12 claims
What is claimed is:     1. A method of selectively detecting the presence of a chemical entity within an environment comprising placing a selective chemical sensor in said environment and detecting mass changes of the piezoelectric surface resulting from sorption of material thereon, said chemical sensor comprising:
  • (a) a piezoelectric substrate capable of detecting mass changes resulting from sorption of material thereon; and
  • (b) a coating applied to said substrate, which selectively sorbs chemical entities of a size less than a preselected magnitude, wherein the chemical entity to be detected is CO or a hydrocarbon,
  • wherein element (a) is a surface acoustic wave (SAW) device or a quartz crystal microbalance (QCM) device,
  • wherein element (b) is a film containing zeolite crystals, wherein the pores within said zeolite crystals provide molecule sieving capability, and
  • wherein said film is an inorganic silica matrix having zeolite crystals embedded therein.


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Forward References: Show 54 U.S. patent(s) that reference this one

       
U.S. References: Go to Result Set: All U.S. references   |  Forward references (54)   |   Backward references (10)   |   Citation Link

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PDF
Patent  Pub.Date  Inventor Assignee   Title
Buy PDF- 8pp US3309844  1967-03 Hemstreet et al.   Process for adsorbing gases
Buy PDF- 3pp US3372531  1968-03 Hoenig   VACUUM DEVICE
Buy PDF- 6pp US4208194  1980-06 Nelson  Minnesota Mining and Manufacturing Company Monitoring device
Buy PDF- 4pp US4244713  1981-01 Goodwin  The Medishield Corporation Limited Apparatus for analysis of absorbed gases
Buy PDF- 9pp US4595403  1986-06 Sago et al.  Toho Gas Co. Ltd. Heat exchange element
Buy PDF- 4pp US4599095  1986-07 Barnes et al.  Honeywell Inc. Thin bed sorption/desorption apparatus and method for making the same
Buy PDF- 7pp US4865996  1989-09 Castleman et al.  Brunswick Corporation Sorption/desorption method and apparatus
Buy PDF- 10pp US4925459  1990-05 Rojey et al.  Institut Francais Du Petrole Process for separation of the constituents of a mixture in the gas phase using a composite membrane
Buy PDF- 14pp US4935040  1990-06 Goedert  The Perkin-Elmer Corporation Miniature devices useful for gas chromatography
Buy PDF- 12pp US4936877  1990-06 Hultquist et al.  Advanced Technology Materials, Inc. Dopant delivery system for semiconductor manufacture
       
Foreign References: None

Other References:
  • Bein et al., "Molecular Sieve Sensors for Selective Detection at the Nanogram Level," Journal of the American Chemical Society, vol. 111, No. 19, pp. 7640-7641, Sep. 13, 1989. (2 pages) Cited by 10 patents
  • Lynch (editor), CRC Handbook of Materials Science, vol. 111, Nonmetallic Materials and Applications, CRC Press, Inc.: Boca Raton, FL, pp. 198-200 (1975).
  • Ku et al., Electrical Properties of Polymers, Hanser Publishers, Munich, pp. 7-17 (1987).
  • Ricco et al., "Determination of BET Surface Areas of Porous Thin Films Using Surface Acoustic Wave Devices," Langmuir, 5, pp. 273-276 (1989). (4 pages) Cited by 3 patents
  • Brinker et al., ed., "Better Ceramics Through Chemistry 111", Mat. Res. Soc. Symp. Proc., vol. 121, Materials Research Soc., pp. v-xiii Apr. 5-8, 1988.
  • Carey et al., "Multicomponent Analysis Using an Array of Piezoelectric Crystal Sensors," Analytical Chem., vol. 59, pp. 1529-1534 (1987). (6 pages) Cited by 10 patents
  • Carey et al., "Monitoring a Dryer Operation Using An Array of Piezoelectric Crystals", Analytical Chem. vol. 60, pp. 541-544 (1988). (4 pages) Cited by 6 patents
  • Frye et al., "Characterization of the Surface Area and Porosity of Sol-Gel Films Using SAW Devices", Mat. Res. Soc. Symp. Proc., vol. 121, Materials Research Company, pp. 349-354 (1988).
  • J. Am. Chem. Soc., 111, pp. 7640-7641 (1989). (2 pages) Cited by 10 patents
  • C&EN, Sep. 25, 1989, p. 32.
  • MRS Bulletin, May 1990, pp. 10-11.
  • Chemecology, vol. 19, No. 2, Mar. 1990, p. 5.
  • C&EN, Jan. 29, 1990, pp. 24-26.
  • "Advances in Sensor Technology Promise Reduce Risk From Toxic Substrates", News Release, Materials Research Society, pp. 1-5 (Apr. 1990).
  • Inside R&D, vol. 19, No. 16, Apr. 18, 1990.
  • Browne, "Gains Reported in Detecting Toxic Substances", The New York Times Science, Dec. 26, 1989.


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