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Title: JP06201779A2: TEST CIRCUIT
[ Derwent Title ]


Country:
Kind:
JP Japan
A DOC. LAID OPEN TO PUBL. INSPEC. [PUBLISHED FROM 1971 ON] i

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Inventor: TODOROKI TETSUO;

Assignee: RICOH CO LTD
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Published / Filed: 1994-07-22 / 1993-01-05

Application Number: JP1993000000199

IPC Code: Advanced: G01R 31/28; H03H 15/00; H03H 17/02; H03H 17/06;
Core: more...
IPC-7: G01R 31/28; H03H 15/00; H03H 17/06;

Priority Number:
1993-01-05  JP1993000000199

Abstract:     PURPOSE: To quickly carry out the motion check of a transversal filter by inputting the same operating data into each of a plurality of the same operation elements, and judging a difference in the result of an operation carried out through each operation element.
    CONSTITUTION: In a transversal filter 502 which has received the data of a multiplier and a multiplicand from an updown counter, the identity of the result of computation output from each of multiplying instruments a1 to an is judged by an EXOR (exclusive OR) gate provided in a comparator e1. When all of the results of computations input from each multiplying instrument are the same, the comparator e1 outputs a low level signal, and when the above result of computation is not the same, the comparator e1 outputs a high level signal. A signal output from the comparator e1 is input into F/F, and in the case where the signal is a high level, LED is radiated.
    COPYRIGHT: (C)1994,JPO&Japio

Family: None

       
Forward References: Go to Result Set: Forward references (1)
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Patent  Pub.Date  Inventor Assignee   Title
Buy PDF- 21pp US5790439  1998-08-04 Yamanaka; Kazuya  Mitsubishi Denki Kabushiki Kaisha Reduced test time finite impulse response digital filter
       
Other Abstract Info: DERABS G94-273758 DERG94-273758 JAPABS 180555P000135 JAP180555P000135

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