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Title: US5610528: Capacitive bend sensor
[ Derwent Title ]


Country: US United States of America

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7 pages

 
Inventor: Neely, James S.; Wappingers Falls, NY
Restle, Phillip J.; Katonah, NY

Assignee: International Business Machines Corporation, Armonk, NY
other patents from INTERNATIONAL BUSINESS MACHINES CORPORATION (280070) (approx. 44,393)
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Published / Filed: 1997-03-11 / 1995-06-28

Application Number: US1995000496236

IPC Code: Advanced: G01B 7/30; G01B 21/22; G01D 5/241;
IPC-7: G01B 7/30; G01R 27/26; H01G 5/14;

ECLA Code: A61B5/107A; A61B5/45K; G01D5/241B;

U.S. Class: Current: 324/660; 033/001.N; 324/071.1; 324/686; 361/278; 361/292; 361/296;
Original: 324/660; 324/686; 324/071.1; 033/001.N; 361/278; 361/292; 361/296;

Field of Search: 324/658,660,681,686,687,690,71.1 033/1 N,1 PT,534 361/278,292,296

Priority Number:
1995-06-28  US1995000496236

Abstract:     A capacitive bend sensor includes a first element having a comb-patterned portion of conducting material, and a second element having a comb-patterned portion of conducting material. A dielectric material is disposed between the comb-patterned portion of the first element and the comb-patterned portion of the second element. The first element is bonded to the second element such that the comb-patterned portion of the first element slides relative to the comb-patterned portion of the second element when the first and second elements are bent. Bend angle is measured according to the alignment of the comb-patterned portion of the first element and the comb-patterned portion of the second element. The sensor may be coupled to a human finger to measure bend angle of the finger, or may be coupled to a joint of a human body to measure bend angle of the joint.

Attorney, Agent or Firm: Sbrollini, Jay P. ;

Primary / Asst. Examiners: Wieder, Kenneth A.; Brown, Glenn W.

Maintenance Status: E2 Expired  Check current status

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First Claim:
Show all 6 claims
We claim:     1. A sensor for measuring bend angle comprising:
  • a first element having a comb-patterned portion of conducting material;
  • a second element having a comb-patterned portion of conducting material;
  • a dielectric material between said comb-patterned portion of said first element and said comb-patterned portion of said second element;
  • wherein said first element is bonded to said second element such that said comb-patterned portion of said first element slides relative to said comb-patterned portion of said second element when said first and second elements are bent; and
  • wherein said bend angle is measured according to alignment of said comb-patterned portion of said first element and said comb-patterned portion of said second element.


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Forward References: Show 15 U.S. patent(s) that reference this one

       
U.S. References: Go to Result Set: All U.S. references   |  Forward references (15)   |   Backward references (11)   |   Citation Link

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Patent  Pub.Date  Inventor Assignee   Title
Get PDF - 7pp US3723866  1973-03 Michaud et al.  Commissariat A L'Energie Atomique CAPACITIVE MOVEMENT MEASURING DEVICE
Get PDF - 19pp US4743902  1988-05 Andermo  Stiftelsen Institutet for Mikrovagsteknik vid Tekniska Hogskolan Measuring device for capacitive determination of the relative position of the two with respect to one another movable parts
Get PDF - 8pp US4810951  1989-03 Meyer   Capacitative device for measuring lengths and angles
Get PDF - 4pp US4940063  1990-07 Challis   Angular displacement measuring apparatus
Get PDF - 14pp US4941363  1990-07 Doemens et al.  Siemens Aktiengesellschaft Sensor for measurement of the torque acting on a rotating shaft
Get PDF - 7pp US4977811  1990-12 Suzuki et al.  Yamaha Corporation Angle sensor for musical tone control
Get PDF - 41pp US5023559  1991-06 Andermo  Mitutoyo Corporation Capacitance-type measuring device for absolute measurement of positions
Get PDF - 12pp US5055838  1991-10 Wise et al.  The Regents of the University of Michigan Silicon tactile imaging array and method of making same
Get PDF - 19pp US5237284  1993-08 VanDerValk  Presidium Promotions Limited Measurement of capacitance and parameters related thereto for determining displacement
Get PDF - 16pp US5304937  1994-04 Meyer   Capacitive position sensor with an electrode array cursor and topographically featured scale
Get PDF - 7pp US5313840  1994-05 Chen et al.  AT&T Bell Laboratories Tactile shear sensor using anisotropically conductive material
       
Foreign References: None

Other Abstract Info: DERABS G97-178530 DERG97-178530

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