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Title: US5870834: Six-axis metrology sensor device
[ Derwent Title ]


Country: US United States of America

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9 pages

 
Inventor: Sheldon, Paul C.; Mequon, WI

Assignee: Sheldon/Van Someren, Inc., Wauwatosa, WI
other patents from SHELDON/VAN SOMEREN, INC. (738702) (approx. 8)
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Published / Filed: 1999-02-16 / 1996-10-22

Application Number: US1996000735102

IPC Code: Advanced: G01B 5/004; G01B 21/04;
Core: G01B 21/02; more...
IPC-7: G01B 5/004; G01B 7/004;

ECLA Code: G01B5/004; G01B21/04D;

U.S. Class: Current: 033/556; 033/502; 033/503; 074/479.01;
Original: 033/556; 033/502; 033/503; 074/479.01;

Field of Search: 033/556,1 M,502,503,558,559,561 074/479.01 073/866.5 483/001 409/201,132,235 403/157

Priority Number:
1996-10-22  US1996000735102

Abstract: A metrology device determines the position of a machine component relative to a datum along three linear and three rotational axes. The metrology device has a pair of support structures connected by six legs that are each disposed at an angle with respect to the next adjacent leg. One of the support structures can be connected to the datum and the other can be connected to the machine component. A sensor cooperates with each leg to sense the actuation of that leg as the support structures move relative to one another. The combination of signals provided by the legs can be used to track movement of the machine component relative to the datum.

Attorney, Agent or Firm: Van Someren, Robert A. ;

Primary / Asst. Examiners: Fulton, Christopher M.;

Maintenance Status: E2 Expired  Check current status

INPADOC Legal Status: Show legal status actions

Family: None

First Claim:
Show all 20 claims
What is claimed is:     1. A metrology device for determining, along a plurality of axes, the position of a movable machine component relative to a datum, comprising:
  • a first structure that may be removably connected to a datum structure;
  • a second structure having a connector configured to be connected to the movable machine component;
  • at least six legs, each leg being pivotably connected to the first structure and the second structure, wherein the datum structure is on an opposite side of the first structure from the at least six legs and the movable machine component is on an opposite side of the second structure from the at least six legs;
  • a plurality of sensors arranged to measure movement of the second structure relative to the first structure potentially along three linear axes and three rotational axes; and
  • a biasing mechanism to bias the first structure away from the second structure.


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Description: Show description

Forward References: Show 11 U.S. patent(s) that reference this one

       
U.S. References: Go to Result Set: All U.S. references   |  Forward references (11)   |   Backward references (2)   |   Citation Link

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PDF
Patent  Pub.Date  Inventor Assignee   Title
Buy PDF- 22pp US5489168  1996-02 Sheldon et al.  Giddings & Lewis Metrology instrument arm system
Buy PDF- 7pp US5571222  1996-11 Ludwig  Carl Zeiss Jena GmbH Process and arrangement for measuring tapered thread
       
Foreign References: None

Other Abstract Info: DERABS G1999-166196 DERABS G1999-166196

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