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Title: US6024526: Integrated prober, handler and tester for semiconductor components
[ Derwent Title ]


Country: US United States of America

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25 pages

 
Inventor: Slocum, Alexander H.; Bow, NH
Muller, Luis A.; Cambridge, MA

Assignee: Aesop, Inc., Concord, NH
other patents from ADVANCED ENGINEERING SYSTEMS, OPERATIONS & PRODUCTS, INC. (7695) (approx. 31)
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Published / Filed: 2000-02-15 / 1995-10-20

Application Number: US1995000546236

IPC Code: Advanced: B25J 17/02; H01L 21/00; H01L 21/683;
Core: H01L 21/67; more...
IPC-7: B25J 15/06;

ECLA Code: B25J17/02B2; H01L21/00S8D; H01L21/00S8; H01L21/683V;

U.S. Class: Current: 414/226.01; 901/040;
Original: 414/226.01; 901/040;

Field of Search: 414/222,225,226,403,729,736,737,222.01,225.01,226.01 901/028,29,47,8,16,40 294/64.1,65 029/832,833,834,740

Priority Number:
1995-10-20  US1995000546236

Abstract: An integral unit for use in testing semiconductor components. The unit is designed to manipulate either packaged semiconductor components or semiconductor wafers and present them to a test head. It provides significant space savings because it replaces the need for separate prober, handler and tester units. The integrated unit includes a positioning mechanism with a tool plate that can be changed to grasp either a semiconductor wafer or a tray of semiconductor components. The tool plate uses a vacuum plate. To hold a tray of semiconductor parts, the vacuum plate has numerous independently operable holes. Each hole is positioned behind one semiconductor component and can be engaged or released separately so that the components can be sorted into separate output bins. To hold a wafer, the tool plate has an extendible tongue member that can be inserted into a stack of semiconductor wafers to pick up one wafer in the stack. One disclosed positioning mechanism is a hexapod unit, which, due to its light weight, allows fast and accurate positioning of the semiconductor devices. Multiple positioning mechanisms are used in some instances to increase throughput.

Attorney, Agent or Firm: Walsh, Edmund J. ;

Primary / Asst. Examiners: Underwood, Donald W.;

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Designated Country: CN EP JP KR 

Family: Show 2 known family members

First Claim:
Show all 29 claims
What is claimed is:     1. Apparatus for processing a plurality of semiconductor devices held in a tray, comprising:
  • a) a base;
  • b) an input zone in the base adapted to hold the tray;
  • c) a work station, coupled to the base, at which semiconductor devices are processed;
  • d) a positioning mechanism having a distal portion and a coupling between the base and the distal portion, the coupling being movable with a range of motion encompassing at least the input zone and the work station and being further movable with degrees of freedom allowing the distal portion to be tilted relative to the input zone; and
  • e) a tray pickup, connected to the distal portion of the positioning mechanism, the tray pickup including means for selectively releasing semiconductor devices without releasing the tray.


Background / Summary: Show background / summary

Drawing Descriptions: Show drawing descriptions

Description: Show description

Forward References: Show 21 U.S. patent(s) that reference this one

       
U.S. References: Go to Result Set: All U.S. references   |  Forward references (21)   |   Backward references (27)   |   Citation Link

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PDF
Patent  Pub.Date  Inventor Assignee   Title
Buy PDF- 6pp US3451224  1969-06 Colechia et al.   STOWABLE UNDERWATER MANIPULATOR
Buy PDF- 9pp US3584741  1971-06 Schirmer  International Business Machines Corporation BATCH SORTING APPARATUS
Buy PDF- 4pp US3910621  1975-10 Hillier  Go-Con Concrete Limited Suction devices
Buy PDF- 6pp US3973795  1976-08 Goransson  Internationella Siporex Aktiebolaget Lifting device for handling cut cellular concrete bodies
Buy PDF- 15pp US4571149  1986-02 Soroka et al.  Westinghouse Electric Corp. General purpose orthogonal axes manipulator system
Buy PDF- 10pp US4648786  1987-03 Sakurai  Kabushiki Kaisha Komatsu Seisakusho Press machine
Buy PDF- 9pp US4654955  1987-04 Mathie  The Valeron Corporation Tool changer mechanism for machining centers
Buy PDF- 7pp US4675993  1987-06 Harada  TDK Corporation Electronic component mounting system having a vacuum suction head with a magnetic sensor for locating an electronic component with a magnet mark
Buy PDF- 8pp US4715591  1987-12 Sato et al.  Picker International, Inc. Patient support for radiation imaging
Buy PDF- 17pp US4760924  1988-08 Sato et al.  Takeda Riken Co., Ltd. IC test equipment having input magazine replenisher
Buy PDF- 15pp US4926118  1990-05 O'Conner et al.  Sym-Tek Systems, Inc. Test station
Buy PDF- 4pp US4936329  1990-06 Michael et al.  Leybold Aktiengesellschaft Device for cleaning, testing and sorting of workpieces
Buy PDF- 8pp US5052736  1991-10 Loncaric et al.  The University of Maryland Modular dexterous hand
Buy PDF- 17pp US5114300  1992-05 Shahinpoor et al.  Wovenwire Corporation Robotic apparatus
Buy PDF- 8pp US5129279  1992-07 Rennex   Flexible robotic limb
Buy PDF- 11pp US5131535  1992-07 O'Conner et al.  SymTek Systems, Inc. Electrical device transport medium
Buy PDF- 9pp US5161936  1992-11 Kato  Mitsubishi Denki Kabushiki Kaisha Industrial robot apparatus
Buy PDF- 7pp US5168218  1992-12 Rich   Tray-to-tray circuit package handler
Buy PDF- 8pp US5177434  1993-01 Suzuki et al.  Advantest Corporation IC test equipment having a horizontally movable chuck carrier
Buy PDF- 8pp US5180974  1993-01 Mitchell et al.  Micron Technology, Inc. Semiconductor testing and shipping system
Buy PDF- 9pp US5284413  1994-02 Wilkinson et al.  Intelmatec Corporation Apparatus for loading and unloading thin integrated circuits into and from carriers
Buy PDF- 22pp US5290134  1994-03 Baba  Advantest Corporation Pick and place for automatic test handler
Buy PDF- 23pp US5307011  1994-04 Tani  Advantest Corporation Loader and unloader for test handler
Buy PDF- 25pp US5350269  1994-09 Azuma et al.  Canon Kabushiki Kaisha Work pick-up apparatus
Buy PDF- 12pp US5384531  1995-01 Yamazaki et al.  Mitsubishi Electrical Engineering Co. Ltd. Apparatus for inspecting characteristics of semiconductor chips
Buy PDF- 11pp US5451134  1995-09 Bryfogle   Material handling devices and controllers
Buy PDF- 50pp US5544421  1996-08 Thompson  Semitool, Inc. Semiconductor wafer processing system
       
Foreign References:
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PDF
Publication Date IPC Code Assignee   Title
Buy PDF- 21pp EP0712269 1996-05  H05K 13/08 YAMAHA HATSUDOKI KABUSHIKI KAISHA Method and apparatus for mounting a part at a specfific position 
Buy PDF- 14pp EP0749002 1996-12  G01D 5/241 Hewlett-Packard Company Position detection device 
Buy PDF FR2543186 1984-09  E02B 3/14 KAVOS STEPHANE NOUVEAU PROCEDE DE FABRICATION DE BLOCS ARTIFICIELS EN FORME DE TETRAPODES, DE PENTAPODES ET/OU D'HEXAPODES DESTINES A LA CONSTRUCTION D'OUVRAGES HYDRAULIQUES 
Buy PDF - 6pp DE4117538 1992-07  G02B 23/16 ANT Nachrichtentechnik GmbH, 7150 Backnang, DE Anordnung zum Stuetzen und Ausrichten von Antennen oder Teleskopen 
  JP61056927 1986-08  H01L 21/66    
Buy PDF- 110pp WO9217313 1992-10  B23Q 1/14 BAILEY, Ralph, Peter, Steven MECHANICAL MANIPULATOR 
Buy PDF- 46pp WO9429946 1994-12  H02N 2/10 BAILEY, Ralph, Peter, Steven IMPROVEMENTS RELATING TO ROTARY DRIVE MECHANISMS 


Other References:
  • Tegal Advertisement, Electronics News , Sep. 25, 1995.
  • Geodetics Brochure, undated.


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