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Title: US6049621: Determining a point correspondence between two points in two respective (fingerprint) images
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Country: US United States of America

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32 pages

 
Inventor: Jain, Anil K.; Okemos, MI
Hong, Lin; Lansing, MI
Bolle, Rudolf Maarten; Bedford Hills, NY
Pankanti, Sharathchandra Umapathirao; Mt. Kisco, NY

Assignee: International Business Machines Corporation, Armonk, NY
other patents from INTERNATIONAL BUSINESS MACHINES CORPORATION (280070) (approx. 44,393)
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Published / Filed: 2000-04-11 / 1998-02-25

Application Number: US1998000030345

IPC Code: Advanced: G06K 9/00;
Core: more...
IPC-7: G06K 9/00;

ECLA Code: G06K9/00A3;

U.S. Class: Current: 382/125; 382/173;
Original: 382/125; 382/173;

Field of Search: 382/125,115,124,173,209

Priority Number:
1998-02-25  US1998000030345
1997-08-22  US1997000056677P

Abstract: The invention is a system and method for determining a correspondence between a point selected from a set of points extracted from one image and an another point selected from the second set of points extracted from another image based on similarity of relationships of attributes associated with segments attached to the points.

Attorney, Agent or Firm: Percello, Louis J. ;

Primary / Asst. Examiners: Kelley, Christopher S.;

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Parent Case:     This patent claims priority to provisionally filed patent application No. 60/056,677 filed on Aug. 22, 1997.

Family: Show 11 known family members

First Claim:
Show all 8 claims
What is claimed is:     1. A system for determining a point correspondence between two points in two respective image, comprising:
  • a computer having one or more central processing units (CPUs) and a memory;
  • a first image stored in the memory, the first image having one or more first points each of the first points located on a respective first curved line;
  • one or more second images stored in the memory, the second image having one or more second points each of the second points located on a respective second curved line;
  • a first reference point selector, executed by the CPU, that selects one of the first points as a first reference point, the first reference point selector also selecting a first reference segment the first curved line on which the first reference point is located;
  • a second reference point selector, executed by the CPU, that selects one of the second points as a second reference point, the second reference point selector also selecting a second reference segment the second curved line on which the second reference point is located;
  • a first segmentor, executed by the CPU, that segments the first reference segment into two or more first subsegments, each of the first subsegments ending at a respective first subsegment point, the first segmentor determining a first set of first segment relations between the first reference point and one or more of the first subsegment points;
  • a second segmentor, executed by the CPU, that segments the second reference segment into two or more second subsegments, each of the second subsegments ending at a respective second subsegment point, the second segmentor determining a second set of second segment relations between the second reference point and one or more of the second subsegment points; and
  • a reference point matcher, executed by the CPU, that determines a correspondence between the first reference point and one of the second reference points if the set of first segment relations have the same values as the respective values of the set of second segment relations.


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Forward References: Show 30 U.S. patent(s) that reference this one

       
U.S. References: Go to Result Set: All U.S. references   |  Forward references (30)   |   Backward references (7)   |   Citation Link

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Patent  Pub.Date  Inventor Assignee   Title
Buy PDF- 50pp US4151512  1979-04 Riganati et al.  Rockwell International Corporation Automatic pattern processing system
Buy PDF- 23pp US4310827  1982-01 Asai  Nippon Electric Co., Ltd. Device for extracting a density as one of pattern features for each feature point of a streaked pattern
Buy PDF- 68pp US4817183  1989-03 Sparrow   Fingerprint recognition and retrieval system
Buy PDF- 13pp US4947442  1990-08 Tanaka et al.  NEC Corporation Method and apparatus for matching fingerprints
Buy PDF- 18pp US5140642  1992-08 Hsu et al.  Hsu; Wen Hsing Method and device for allocating core points of finger prints
Buy PDF- 17pp US5497429  1996-03 Shibuya  NEC Corporation Apparatus for automatic fingerprint classification
Buy PDF- 42pp US5631971  1997-05 Sparrow   Vector based topological fingerprint matching
       
Foreign References: None

Other Abstract Info: DERABS G2000-338214 DERABS G2000-338214

Other References:
  • N. K. Ratha, S. C. Chen and A. K. Jain, "Adaptive Flow Orientation Based Feature Extraction in Fingerprint Images", Journal of Pattern Recognition, vol. 28, No. 11, pp. 1657, Nov., 1995. (16 pages) Cited by 22 patents [ISI abstract]
  • N. Ratha, K. Karu, S. Chen and A. K. Jain, A Real-time Matching System for Large Fingerprint Database, IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 18, No. 8, pp. 799-813, 1996. (15 pages) Cited by 18 patents [ISI abstract]


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