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 Title: |
US6105149:
System and method for diagnosing and validating a machine using waveform data
[ Derwent Title ]
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| Country: |
US United States of America
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| Inventor: |
Bonissone, Piero Patrone; Schenectady, NY
Chen, Yu-To; Niskayuna, NY
Ramani, Vipin Kewal; Niskayuna, NY
Shah, Rasiklal Punjalal; Latham, NY
Johnson, John Andrew; Delafield, WI
Steen, Phillip Edward; Delafield, WI
Ramachandran, Ramesh; Niskayuna, NY
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| Assignee: |
General Electric Company, Schenectady, NY
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| Published / Filed: |
2000-08-15
/ 1998-03-30
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| Application Number: |
US1998000050143
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| IPC Code: |
Advanced:
A61B 5/055;
G01R 33/28;
G06F 9/44;
G06F 11/22;
G06F 11/25;
G06F 19/00;
G06N 5/04;
Core:
G06N 5/00;
more...
IPC-7:
G06F 11/00;
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| ECLA Code: |
G06F19/00M5I; G06F11/25E; G06F19/00M3L1;
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| U.S. Class: |
Current:
714/026;
706/062;
714/025;
714/037;
714/E11.157;
Original:
714/026;
714/025;
714/026;
714/037;
706/062;
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| Field of Search: |
714/026,25,37
706/010,14,22,62,1,15
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| Priority Number: |
| 1998-03-30 |
US1998000050143 |
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| Abstract: |
The present invention discloses a system and method for diagnosing and validating a machine with waveform data generated therefrom. In this invention, historical waveform data are obtained from machines having known faults along with corresponding actions for repairing the machines and are used to develop fault classification rules. The fault classification rules are stored in a diagnostic knowledge database. The database of classification rules are used to diagnose new waveform data from a machine having an unknown fault.
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| Attorney, Agent or Firm: |
Goldman, Dave C. ;
Breedlove, Jill M. ;
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| Primary / Asst. Examiners: |
Beausoliel, Jr., Robert W.; Weir, James G.
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| INPADOC Legal Status: |
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Family Legal Status Report
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| Designated Country: |
AU CA EP JP DE FR GB NL
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| Family: |
Show 12 known family members
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First Claim:
Show all 33 claims |
What is claimed is:
1. A system for diagnosing a machine from waveform data generated therefrom, comprising:
- a diagnostic knowledge base containing a plurality of rules for diagnosing faults in a machine and a plurality of corrective actions for repairing the faults;
- a diagnostic parser for removing extraneous data from the waveform data;
- a diagnostic fault detector for categorizing the waveform data as normal and faulty data;
- a diagnostic feature extractor for extracting a plurality of features from the waveform data categorized as faulty data; and
- a diagnostic fault isolator coupled to the diagnostic feature extractor and the diagnostic knowledge base for isolating a candidate set of faults for the extracted features and identifying root causes most likely responsible for the candidate set of faults.
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| Background / Summary: |
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| Drawing Descriptions: |
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| Description: |
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| Forward References: |
Show 14 U.S. patent(s) that reference this one
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