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 Title: |
US6132084:
Infrared non-contact temperature measurement for household appliances
[ Derwent Title ]
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| Country: |
US United States of America
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| Inventor: |
Whipple, III, Walter; Amsterdam, NY
Alley, Robert Philbrick; North Myrtle Beach, SC
Bonissone, Piero Patrone; Schenectady, NY
Dausch, Mark Edward; Latham, NY
Badami, Vivek Venugopal; Schenectady, NY
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| Assignee: |
General Electric Company, Schenectady, NY
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| Published / Filed: |
2000-10-17
/ 1998-11-30
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| Application Number: |
US1998000201024
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| IPC Code: |
Advanced:
G01J 5/04;
H05B 6/68;
H05B 6/80;
Core:
more...
IPC-7:
G01J 5/00;
H05B 6/50;
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| ECLA Code: |
H05B6/68M2B3A; G01J5/04B; H05B6/80D3H; T05B206/02; T05B206/12;
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| U.S. Class: |
Current:
374/131;
219/711;
374/126;
374/128;
374/149;
Original:
374/131;
374/126;
374/128;
374/149;
219/711;
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| Field of Search: |
374/131,128,126,149,178,161
219/711
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| Priority Number: |
| 1998-11-30 |
US1998000201024 |
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| Abstract: |
A temperature sensor system for a household appliance, such as a microwave oven, that provides for a non-contact self-calibrating measurement of the temperature of an object disposed in a chamber of the appliance. The system comprises an infrared transmitter and an infrared receiver, as well as a distribution apparatus for coupling the transmitter and receiver to the appliance chamber. A scan pattern of infrared radiation is provided for the chamber and the detected infrared radiation from the chamber is used by a processor to generate an accurate measure of the temperature of the object in the chamber.
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| Attorney, Agent or Firm: |
Ingraham, Donald S. ;
Stoner, Douglas E. ;
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| Primary / Asst. Examiners: |
Gutierrez, Diego; Pruchnic, Jr., Stanley J.
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| Maintenance Status: |
E1 Expired Check current status
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| INPADOC Legal Status: |
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| Family: |
None
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First Claim:
Show all 22 claims |
What we claim is:
1. A temperature sensing system for providing a non-contact measurement of the temperature of an object disposed in a chamber of an appliance, comprising:
- a single infrared radiation source;
- a distribution apparatus coupled to said infrared radiation source and disposed to distribute, from one selected location in said chamber, a scan pattern of transmitted infrared radiation into said chamber and receive reflected infrared radiation passing from said chamber;
- an infrared radiation detector coupled to said distribution apparatus to detect infrared radiation emanating from said chamber and objects within said chamber; and
- a processor coupled to said infrared radiation detector, said processor being responsive to the detected infrared radiation so as to generate a calibrated temperature signal for said object;
- wherein said processor is configured to generate the calibrated temperature signal with correlation of detected reflections of said scan pattern of transmitted infrared radiation.
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| Background / Summary: |
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| Drawing Descriptions: |
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| Description: |
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| Forward References: |
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