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 Title: |
US6285169:
Sag generator with switch-mode impedance
[ Derwent Title ]
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| Country: |
US United States of America
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| Inventor: |
McEachern, Alexander; Oakland, CA
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| Assignee: |
Power Standards Lab., Emeryville, CA
other patents from POWER STANDARDS LAB. (788149) (approx. 1)
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| Published / Filed: |
2001-09-04
/ 2001-02-12
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| Application Number: |
US2001000781171
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| IPC Code: |
Advanced:
G05F 1/70;
Core:
more...
IPC-7:
G05F 1/70;
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| ECLA Code: |
G05F1/70;
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| U.S. Class: |
Current:
323/209;
323/211;
Original:
323/209;
323/211;
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| Field of Search: |
323/205,209,210,211
307/130
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| Priority Number: |
| 2001-02-12 |
US2001000781171 |
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| Abstract: |
A voltage sag generator for alternating current power systems intentionally creates power quality disturbances. The sag generator has a switch-mode impedance between its input and its output. Varying the duty-cycle of the switch-mode impedance causes voltage sags.
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| Primary / Asst. Examiners: |
Berhane, Adolf Deneke;
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| Maintenance Status: |
E1 Expired Check current status
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| INPADOC Legal Status: |
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| Family: |
None
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First Claim:
Show all 3 claims |
I claim:
1. An apparatus for creating voltage sags on an alternating current power system, said apparatus comprising:
- a. an input means capable of accepting alternating current voltage, such alternating current voltage having at least one nominal frequency;
- b. an output means capable of delivering alternating current voltage;
- c. a controlled impedance means between the input means and the output means, such controlled impedance means having an on-state and an off-state;
- d. the controlled impedance means having a duty cycle of the on-state between 0% and 100%, such duty cycle switching between the on-state and the off-state at a switching frequency greater than ten times the nominal frequency.
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| Background / Summary: |
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| Drawing Descriptions: |
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| Description: |
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| Forward References: |
Show 2 U.S. patent(s) that reference this one
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| Foreign References: |
None
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| Other References: |
SEMI F47-0200, Specification for semiconductor processing equipment, Voltage sag immunity, SEMI (Semiconductor Equipment and Materials International, 805 East Middlefield Raod, Mountain View, CA 94043), Feb. 2000.
SEMI F42-0600, Test method for semiconductor processing equipment, voltage sag immunity, SEMI (Semiconductor Equipment and Materials International, 805 East Middlefield Raod, Mountain View, CA 94043), Jun. 2000.
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