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Title: US6643799: System and method for diagnosing and validating a machine using waveform data
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Country: US United States of America

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16 pages

 
Inventor: Bonissone, Piero Patrone; Schenectady, NY
Chen, Yu-To; Niskayuna, NY
Ramani, Vipin Kewal; Niskayuna, NY
Shah, Rasiklal Punjalal; Latham, NY
Johnson, John Andrew; Delafield, WI
Steen, Phillip Edward; Delafield, WI
Ramachandran, Ramesh; Niskayuna, NY

Assignee: General Electric Company, Niskayuna, NY
other patents from GENERAL ELECTRIC COMPANY (218550) (approx. 30,796)
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Published / Filed: 2003-11-04 / 2000-05-03

Application Number: US2000000563983

IPC Code: Advanced: A61B 5/055; G01R 33/28; G06F 9/44; G06F 11/22; G06F 11/25; G06F 19/00; G06N 5/04;
Core: G06N 5/00; more...
IPC-7: G06F 11/00;

ECLA Code: G06F19/00M5I; G06F11/25E; G06F19/00M3L1;

U.S. Class: 714/026; 714/025;

Field of Search: 714/025,26,37 710/010,14,22,62,1,15

Priority Number:
2000-05-03  US2000000563983
1998-03-30  US1998000050143

Abstract:     A system and method for diagnosing and validating a machine with waveform data generated therefrom. Historical waveform data are obtained from machines having known faults along with corresponding actions for repairing the machines and are used to develop fault classification rules. The fault classification rules are stored in a diagnostic knowledge database. The database of classification rules are used to diagnose new waveform data from a machine having an unknown fault.

Attorney, Agent or Firm: Goldman, David C. ; Patnode, Patrick K. ;

Primary / Asst. Examiners: Iqbal, Nadeem; Bonura, Timothy M.

INPADOC Legal Status: None          Buy Now: Family Legal Status Report

       
Related Applications:
Application Number Filed Patent Pub. Date  Title
US1998000050143 1998-03-30    2000-08-15  System and method for diagnosing and validating a machine using waveform data


       
Parent Case:

CROSS-REFERENCE TO RELATED APPLICATIONS
    This application is a continuation of application Ser. No. 09/050,143 filed Mar. 30, 1998, now U.S. Pat. No. 6,105,149, which is hereby incorporated by reference in its entirety.

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First Claim:
Show all 33 claims
What is claimed is:     1. A system for diagnosing a machine from waveform data generated therefrom, comprising:
  • a diagnostic knowledge base containing a plurality of rules for diagnosing faults in a machine and a plurality of corrective actions for repairing the faults;
  • a diagnostic fault detector for categorizing the waveform data as normal and faulty data;
  • a diagnostic feature extractor for extracting a plurality of features from the waveform data categorized as faulty data; and
  • a diagnostic fault isolator coupled to the diagnostic feature extractor and the diagnostic knowledge base for isolating a candidate set of faults for the extracted features and identifying root causes most likely responsible for the candidate set of faults.


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Forward References: Show 2 U.S. patent(s) that reference this one

       
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Patent  Pub.Date  Inventor Assignee   Title
Buy PDF- 16pp US6105149  2000-08 Bonissone et al.  General Electric Company System and method for diagnosing and validating a machine using waveform data
       
Foreign References: None

Other Abstract Info: DERABS C1999-610883

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