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Title: US7103509: System and method for predicting component failures in large systems
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Country: US United States of America

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12 pages

 
Inventor: Shah, Rasiklal Punjalal; Latham, NY, United States of America
Rajiv, Vrinda; Schenectady, NY, United States of America
Osborn, Mark David; Schenectady, NY, United States of America
Asati, Mahesh Kumar; Bangalore, India
Bonissone, Piero Patrone; Schenectady, NY, United States of America

Assignee: General Electric Company, Niskayuna, NY, United States of America
other patents from GENERAL ELECTRIC COMPANY (218550) (approx. 30,796)
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Published / Filed: 2006-09-05 / 2004-11-23

Application Number: US2004000995981

IPC Code: Advanced: G06F 15/00;
Core: more...

ECLA Code: G01D1/00; G01D3/08;

U.S. Class: 702/185; 702/085; 700/052; 706/010; 706/016;

Field of Search: Non/00e

Priority Number:
2004-11-23  US2004000995981

Abstract:     A method for predicting a time to failure of a component in a system is presented. The method comprises obtaining a set of data measurements related to the component. The set of data measurements are representative of a plurality of parameters including a plurality of leading parameters. The method comprises generating a prediction model based upon the leading parameters considered in combination. The prediction model is then used to predict the time to failure of the component based on a set of real-time measurements, wherein the plurality of parameters are processed to predict the time to failure for the component. Finally, a confidence level for the predicted time to failure is determined based upon the plurality of parameters.

Attorney, Agent or Firm: Fletcher Yoder ;

Primary / Asst. Examiners: Tsai, Carol S. W.;

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First Claim:
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    1. A method for predicting a time to failure of a component in a system, the method comprising:

obtaining a set of data measurements related to the component, wherein the set of data measurements are representative of a plurality of parameters, including a plurality of leading parameters;

generating a prediction model based upon the leading parameters considered in combination, wherein generating the prediction model comprises processing the set of data measurements based on a set of rules related to the plurality of parameters and one or more failure modes related to the component;

using the prediction model to predict the time to failure of the component based on a set of real-time data measurements, wherein the plurality of parameters are processed to predict the time to failure for the component; and

determining a confidence level for the predicted time to failure based upon the plurality of parameters.



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Forward References: Show 3 U.S. patent(s) that reference this one

       
U.S. References: Go to Result Set: All U.S. references   |  Forward references (3)   |   Backward references (9)   |   Citation Link

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Patent  Pub.Date  Inventor Assignee   Title
Buy PDF- 13pp US5646540  1997-07 Stals et al.  Interuniversitair Micro-Elektronic Centrum VZW Apparatus and method for measuring electromagnetic ageing parameter of a circuit element and predicting its values
Buy PDF- 14pp US5942689  1999-08 Bonissone et al.  General Electric Company System and method for predicting a web break in a paper machine
Buy PDF- 13pp US6073040  2000-06 Kiyuna  NEC Corporation Electrophysiological activity estimation method
Buy PDF- 45pp US20030065409A1  2003-04 Raeth et al.   Adaptively detecting an event of interest
Buy PDF- 11pp US20040216000A1  2004-10 Koehler et al.   Reconfiguration method for a sensor system comprising at least one set of observers for failure compensation and guaranteeing measured value quality
Buy PDF- 49pp US20050015009A1  2005-01 Mourad et al.   Systems and methods for determining intracranial pressure non-invasively and acoustic transducer assemblies for use in such systems
Buy PDF- 14pp US20050109049A1  2005-05 Chan   Method and system for modeling of magnet cryogen cooler systems
Buy PDF- 12pp US20050148845A1  2005-07 Dean et al.   SYSTEM AND METHOD FOR PREDICTIVE THERMAL OUTPUT CONTROL OF A MEDICAL DEVICE
Buy PDF- 20pp US20050288812A1  2005-12 Cheng et al.   Quality prognostics system and method for manufacturing processes
       
Foreign References: None

Other References:
  • U.S. Appl. No. 10/722,646, filed Nov. 26, 2003, James Joseph Zaput.


  • Continuity Data:
    Application Number Filed Notes

    US2004000995981 2004-11-23  is a related to the prior publication
         US20060111857A1 issued 2006-05-25  System and method for predicting component failures in large systems


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