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Title: US7332929: Wide-scan on-chip logic analyzer with global trigger and interleaved SRAM capture buffers
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Country: US United States of America

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Inventor: Normoyle, Kevin B.; Santa Clara, CA, United States of America
Reddy, Sreenivas; Castro Valley, CA, United States of America
Phillips, John; Santa Clara, CA, United States of America

Assignee: Azul Systems, Inc., Mountain View, CA, United States of America
other patents from AZUL SYSTEMS, INC. (874053) (approx. 2)
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Published / Filed: 2008-02-19 / 2006-03-03

Application Number: US2006000308048

IPC Code: Advanced: G01R 31/28; G06F 11/00;
Core: more...

ECLA Code: G01R31/3185S; G01R31/3177; S11C29/16;

U.S. Class: 326/016; 714/030; 714/039; 714/724; 714/726; 714/723;

Field of Search: 326/016,37-41,47,101 714/030,39,724,726,733

Priority Number:
2006-03-03  US2006000308048

Abstract:     A system chip has many local blocks including processor cores, caches, and memory controllers. Each local block has a local sample-select mux that is controlled by a local selection control register. The mux selects from among hundreds of internal sample nodes in the local block, and can also pass through samples output by an upstream local block. The selected samples from local blocks are sent to a central on-chip logic analyzer that compares the samples to a maskable trigger value. When the trigger value is matched, a trigger state machine advances, and samples are stored into a central capture buffer. A user debugging the chip can later read out the central capture buffer at a slower speed. Thousands of internal nodes from local blocks can be selected for sampling, triggering, and debugging. Local blocks include valid bits in 64-bit-wide samples. Only valid samples are written to the capture buffer.

Attorney, Agent or Firm: Auvinen, Stuart T. ; g Patent LLC ;

Primary / Asst. Examiners: Barnie, Rexford; Tran, Thienvu V

INPADOC Legal Status: Show legal status actions

Family: None

First Claim:
Show all 20 claims
    1. A system chip with an on-chip logic analyzer integrated onto the system chip comprising:

a plurality of local functional blocks that perform functions for the system chip;

a local selector, in each local functional block, the local selector outputting sampled signals that are selected from internal nodes within a local functional block;

a selection control register that controls the local selector;

a trigger comparator that receives the sampled signals from the plurality of local functional blocks and compares the sampled signals to a trigger value to determine when a trigger occurs;

a trigger state machine that enters a triggered state when the trigger occurs; and

a capture buffer that stores the sampled signals when the trigger occurs;

wherein the sampled signals are readable from the capture buffer for external analysis;

whereby internal nodes from the plurality of local functional blocks are selected for storage in the capture buffer when the trigger occurs;

wherein the trigger state machine comprises multiple levels of sub-state-machines;

wherein the trigger comparator compares multiple trigger values to the sampled signals, wherein different trigger values are compared by the trigger comparator for the multiple levels of the trigger state machine;

wherein the trigger state machine is multi-level and multi-triggered.



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U.S. References: Go to Result Set: All U.S. references   |  No patents reference this one   |   Backward references (21)   |   Citation Link

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Patent  Pub.Date  Inventor Assignee   Title
Buy PDF- 20pp US4979177  1990-12 Jackson  Tektronix, Inc. Enhanced counter/timer resolution in a logic analyzer
Buy PDF- 16pp US6107821  2000-08 Kelem et al.  Xilinx, Inc. On-chip logic analysis and method for using the same
Buy PDF- 9pp US6564347  2003-05 Mates  Intel Corporation Method and apparatus for testing an integrated circuit using an on-chip logic analyzer unit
Buy PDF- 12pp US6633838  2003-10 Arimilli et al.  International Business Machines Corporation Multi-state logic analyzer integral to a microprocessor
Buy PDF- 14pp US6681353  2004-01 Barrow  EMC Corporation Methods and apparatus for obtaining a trace of a digital signal within a field programmable gate array device
Buy PDF- 26pp US6687865  2004-02 Dervisoglu et al.  On-Chip Technologies, Inc. On-chip service processor for test and debug of integrated circuits
Buy PDF- 34pp US6704889  2004-03 Veenstra et al.  Altera Corporation Enhanced embedded logic analyzer
Buy PDF- 11pp US6760898  2004-07 Sanchez et al.  Xilinx, Inc. Method and system for inserting probe points in FPGA-based system-on-chip (SoC)
Buy PDF- 11pp US6822474  2004-11 Chaudhari  Intel Corporation On chip logic analyzer debug bus
Buy PDF- 20pp US6826717  2004-11 Draper et al.  Altera Corporation Synchronization of hardware and software debuggers
Buy PDF- 12pp US6834360  2004-12 Corti et al.  International Business Machines Corporation On-chip logic analyzer
Buy PDF- 24pp US6868376  2005-03 Swoboda  Texas Instruments Incorporated Debug bi-phase export and data recovery
Buy PDF- 19pp US6877114  2005-04 Allen et al.  Delphi Technologies, Inc. On-chip instrumentation
Buy PDF- 20pp US7228472  2007-06 Johnson et al.  Hewlett-Packard Development Company, L.P. System and method to control data capture
Buy PDF- 18pp US20030126502A1  2003-07 Litt   Efficient word recognizer for a logic analyzer
Buy PDF- 14pp US20030126508A1  2003-07 Litt   Method and apparatus for efficiently implementing trace and/or logic analysis mechanisms on a processor chip
Buy PDF- 96pp US20050010880A1  2005-01 Schubert et al.   Method and user interface for debugging an electronic system
Buy PDF- 10pp US20050080581A1  2005-04 Zimmerman et al.   Built-in self test for memory interconnect testing
Buy PDF- 27pp US20050166098A1  2005-07 Davis   DSP bus monitoring apparatus and method
Buy PDF- 12pp US20050183069A1  2005-08 Cepulis   ROM-embedded debugging of computer
Buy PDF- 12pp US20060036919A1  2006-02 Creigh   Embedded logic analyzer
       
Foreign References: None

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