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Title: US7478290: Testing DRAM chips with a PC motherboard attached to a chip handler by a solder-side adaptor board with an advanced-memory buffer (AMB)
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Country: US United States of America

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20 pages

 
Inventor: Co, Ramon S.; Trabuco Canyon, CA, United States of America
Lai, Tat Leung; Torrance, CA, United States of America
Sun, David; Irvine, CA, United States of America

Assignee: Kingston Technology Corp., Fountain Valley, CA, United States of America
other patents from KINGSTON TECHNOLOGY COMPANY (741845) (approx. 14)
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Published / Filed: 2009-01-13 / 2006-07-24

Application Number: US2006000309296

IPC Code: Advanced: G11C 29/00;
Core: more...

ECLA Code: G11C29/56;

U.S. Class: 714/718;

Field of Search: Non/00e

Priority Number:
2006-07-24  US2006000309296

Abstract:     Memory chips are tested by insertion into a chip test socket on a test adapter board that is mounted to the reverse or solder-side of a personal computer motherboard. A memory module socket is removed from the motherboard, and adapter pins are inserted into holes for the removed memory module socket, but from the reverse (solder) side of the motherboard. The adapter pins connect to the test adapter board either directly, through a connector plug, or through an intervening adapter board. The test adapter board has soldered onto it additional memory chips and buffer chips on a memory module, such as an Advanced Memory Buffer (AMB) for a fully-buffered memory module. The built-in-self-test (BIST) feature of the AMB may be used to test the memory chip under test in the chip test socket, or the processor on the motherboard may write and read the memory chip.

Attorney, Agent or Firm: Auvinen, Stuart T. ; g Patent LLC ;

Primary / Asst. Examiners: Chung, Phung M;

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First Claim:
Show all 20 claims
    1. A personal-computer-motherboard memory-chip tester comprising:

a motherboard, the motherboard being a main board for a computer using memory modules as a memory, the motherboard having a component side and a solder side, the component side having integrated circuits mounted thereon and expansion sockets for expansion boards;

a supporting plate, mounted to the motherboard for supporting the motherboard;

a chip test socket for receiving a memory chip for testing by the motherboard, the memory chip being removable from the chip test socket;

a test adapter board having the chip test socket mounted thereon, the test adapter board for transferring data from the motherboard to the memory chip inserted into the chip test socket, the motherboard using the memory chip inserted into the chip test socket as a portion of the memory of the motherboard;

additional memory chips mounted on the test adapter board, wherein the additional memory chips and the memory chip inserted into the chip test socket together form an emulated memory-module memory; and

adapter pins connected between the test adapter board and the motherboard, for electrically connecting the test adapter board to the motherboard,

whereby the memory chip inserted into the chip test socket on the test adapter board is tested by the motherboard accessing the emulated memory-module memory.



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U.S. References: Go to Result Set: All U.S. references   |  No patents reference this one   |   Backward references (16)   |   Citation Link

Buy
PDF
Patent  Pub.Date  Inventor Assignee   Title
Buy PDF- 11pp US4996478  1991-02 Pope  Tektronix, Inc. Apparatus for connecting an IC device to a test system
Buy PDF- 6pp US5795172  1998-08 Shahriari et al.  Intel Corporation Production printed circuit board (PCB) edge connector test connector
Buy PDF- 16pp US6040691  2000-03 Hanners et al.  Credence Systems Corporation Test head for integrated circuit tester arranging tester component circuit boards on three dimensions
Buy PDF- 15pp US6178526  2001-01 Nguyen et al.  Kingston Technology Company Testing memory modules with a PC motherboard attached to a memory-module handler by a solder-side adaptor board
Buy PDF- 7pp US6348810  2002-02 Yanagawa et al.  Hitachi Electronics Engineering Co., Ltd. Interface unit for a tester and method of connecting a tester with a semiconductor device to be tested
Buy PDF- 14pp US6357022  2002-03 Nguyen et al.  Kingston Technology Co. Testing memory modules on a solder-side adaptor board attached to a PC motherboard
Buy PDF- 20pp US6357023  2002-03 Co et al.  Kingston Technology Co. Connector assembly for testing memory modules from the solder-side of a PC motherboard with forced hot air
Buy PDF- 17pp US6415397  2002-07 Co et al.  Kingston Technology Company Automated multi-PC-motherboard memory-module test system with robotic handler and in-transit visual inspection
Buy PDF- 14pp US6742144  2004-05 Co  Kingston Technology Co. Local heating of memory modules tested on a multi-motherboard tester
Buy PDF- 14pp US6762615  2004-07 Lee et al.  Samsung Electronics Co., Ltd. Parallel test board used in testing semiconductor memory devices
Buy PDF- 14pp US6772261  2004-08 D'Antonio et al.  International Business Machines Corporation Interface that allows testing and using memory modules in computer systems not designed for the modules
Buy PDF- 10pp US6910162  2005-06 Co et al.  Kingston Technology Corp. Memory-module burn-in system with removable pattern-generator boards separated from heat chamber by backplane
Buy PDF- 14pp US20030101391A1  2003-05 Man et al.   System for testing multiple devices on a single system and method thereof
Buy PDF- 11pp US20040004490A1  2004-01 Huang   IC component test socket assembly having error protection device
Buy PDF- 13pp US20040024557A1  2004-02 Chi et al.   Control method of an automatic integrated circuit full testing system
Buy PDF- 12pp US20050260868A1  2005-11 Lee   Test apparatus having intermediate connection board for package
       
Foreign References: None

Continuity Data:
Application Number Filed Notes

US2006000309296 2006-07-24  is a related to the prior publication
     US20080126863A1 issued 2008-05-29  Testing DRAM Chips with a PC Motherboard Attached to a Chip Handler by a Solder-Side Adaptor Board with an Advanced-Memory Buffer (AMB)


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