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Title: US7483824: Self-checking test generator for partially-modeled processors by propagating fuzzy states
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Country: US United States of America

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19 pages

 
Inventor: Hill, Eric L.; Palo Alto, CA, United States of America

Assignee: Azul Systems, Inc., Mountain View, CA, United States of America
other patents from AZUL SYSTEMS, INC. (874053) (approx. 2)
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Published / Filed: 2009-01-27 / 2006-03-03

Application Number: US2006000308039

IPC Code: Advanced: G06F 17/50;
Core: more...

ECLA Code: G01R31/3183F3;

U.S. Class: 703/014; 714/733; 714/742; 714/718; 714/741; 438/014; 703/015; 716/004;

Field of Search: 703/014,15 438/014 700/299,110 714/733,742,718,741,738 702/117 716/004 707/001

Priority Number:
2006-03-03  US2006000308039

Abstract:     A self-checking test generator program creates a self-checking test program that can test a device under test (DUT). The self-checking test generator selects instructions for a test. Selected instructions are executed on a software DUT model to generate results that can be self-checked by other instructions such as compare and branch instructions. The software DUT model has fuzzy models and unknown models for blocks in the DUT. Fuzzy models generate expected outputs for a block of the DUT. Fuzzy models may propagate unknown data from their inputs to their outputs. Unknown models do not predict expected outputs. Instead, unknown models always output unknown (X). Over time, as more of the DUT logic is modeled, unknown models may be replaced with fuzzy models.

Attorney, Agent or Firm: Auvinen, Stuart T. ; g Patent LLC ;

Primary / Asst. Examiners: Thangavelu, Kandasamy;

INPADOC Legal Status: Show legal status actions

Family: None

First Claim:
Show all 20 claims
    1. A self-checking test generation system comprising:

a computer with one or more processors and a memory storing a program of instructions executable by the one or more processors, the program of instructions comprising a self-checking test generator comprising:

a device-under-test (DUT) model of a target device, the DUT model having interconnected models for modeling interconnected blocks of the target device;

a plurality of fuzzy models, each fuzzy model being a model of operation of one of the interconnected models in the DUT model;

a plurality of unknown models in the DUT model, each unknown model outputting one or more model outputs in an unknown logic state;

wherein a fuzzy model that receives a model output from an unknown model propagates the unknown logic state for at least some combinations of model inputs to the fuzzy model;

a state storage that receives model outputs from the plurality of fuzzy models, the state storage storing state signals;

an instruction writer that writes a selected instruction, operand or pointer values, and a self-check instruction to a self-check test program, the self-check test program for executing on the target device for testing the target device,

whereby the self-check test program is generated using the fuzzy models.



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U.S. References: Go to Result Set: All U.S. references   |  No patents reference this one   |   Backward references (34)   |   Citation Link

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Foreign References: None

Other References:
  • Bird & Munoz, “Automatic generation of random self-checking test cases”, IBM Systems Journal, vol. 22, No. 3, 1983, p. 229-245.
  • Poe, “Introduction to Random Test Generation for Processor Verification”, Obsidian Software, 7 pp, 2002.


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