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FROM: Delphion
SENT: May 6, 2002
SUBJECT: Delphion News - New Analytical Tool Citation Link
There's patent data - and then there's patent information. With Delphion, you get both.
We provide you with not only complete worldwide patent data, but also the tools and services you need to gain insights from the data to make better business decisions.
With this in mind, we introduce to you Citation Link - our new analytical tool that enables you to quickly and easily discover the companies and technologies associated with a particular patent. Citation Link provides a powerful way to identify new licensing opportunities and gain competitive intelligence.
In this newsletter, we present Citation Link as well as our complete family of analytical tools that enable you to uncover insights from the millions of patents worldwide. It's one more way we show our dedication to providing you with the best patent research solution.
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Introducing Citation Link: FREE Through May 30
Citation Link is Delphion's new analytical tool that graphically displays the relationships between patents. By seeing the companies and technologies related to an innovation, you can uncover licensing opportunities and collect significant intelligence about competitors. In addition, Citation Link can help you identify a patent's significance in the market by showing the number of times it is cited by other patents, a measure often used to indicate the asset's value.
With Citation Link, you have the flexibility to view patent citations in multiple ways. Using the tree format, you can see the patents that are cited by a selected patent, or the patents that cite the selected patent - or both at the same time. Using the timeline format, you can track trends in a particular field of innovation in one, five or 10-year increments.
Plus, Citation Link offers a host of features to help you quickly and easily gain an understanding of the data presented in the citation map. For example, you can plot patent relationships based on a variety of fields, such as title, inventor or classification code; color-code a specific patent or a group of patents to enhance analysis; zoom in or out on specific segments of the map; navigate large maps using a thumbnail overview; and much more.
Citation Link is available now and you can take advantage of it for FREE through May 30, 2002. Try it today!
Find out more:
http://www.delphion.com/products/research/products-citelink
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Get More from Patent Research with Delphion's Analytical Tools
A patent search can give you lots of results. To help you make sense of it all, Delphion gives you a complete set of analytical tools. In addition to Citation Link, these tools include:
Snapshot - summarize your search results visually
With Snapshot's easy-to-read bar charts that summarize patent data, you can quickly identify top patentholders, prolific inventors, patenting activity trends, classification breakdowns and more. And once you've conducted an initial analysis with Snapshot, you can use the tool to dive even deeper into the data. You can focus your search efforts and find the data that's most relevant to you.
Text Clustering - find hidden relationships within patent text
Delphion's exclusive Text Clustering tool groups like-patents together through linguistic analysis of patent text. With it, you can quickly identify groups of patents that share common keywords - revealing relationships between disparate patents - and drill into clusters to find the patents most relevant to your research.
PatentLab II - transform patent data into insightful charts and graphs
The PatentLab II tool enables you to turn patent data into a wide variety of customizable 2D and 3D charts, graphs, tables and reports. With PatentLab II, you can identify key relationships, trends and opportunities.
Find out more:
http://www.delphion.com/products-research
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Learn about Citation Link and More in Delphion's FREE Web-based Seminar
On May 16, you can learn about Citation Link and all our tools and features in an updated version of our popular web-based seminar, "Exploring Delphion's Research Services". This FREE, 60-minute seminar provides an easy way to enhance your patent research skills and learn more about Delphion Research. It also provides you with an opportunity to pose questions and get immediate answers. As always, the seminar will be conducted live, and then archived for you to access anytime in the future.
Register or find out more:
http://www.delphion.com/events/news-exploring
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Contact Us
We appreciate your feedback! Let us know if there are any additional ways we can make your experience with Delphion even better.
To contact us, please visit:
http://www.delphion.com/promo/solutions_contact
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